Technology
At 8D Photonics we specialize in developing custom cryogenic photoluminescence and minority carrier lifetime measurement systems for high quality characterization of your infrared materials. Our unique approach to infrared material characterization relies on photo-generated charge to alter the microwave reflection coefficient of semiconductor materials. Our microwave based measurement technique gives you orders of magnitude more sensitivity than other approaches for infrared material analysis.
Cold
Our cryogen free vacuum system provides safe low temperature operation, giving the best insight into your material characteristics. Our unique wafer characterization platform applies a uniform temperature profile while securing your material during analysis.
Optics
Our approach to lifetime characterization relies on photo-generated charge to alter the microwave reflection coefficient of semiconductor materials. Photoluminescence data is obtained using conventional FTIR spectroscopy. Our integrated optical system will scan your material and provide a high resolution map of your material characteristics. We invite you to learn more about this technique below.
Map
8D Photonics Wafer Mapping software provides user friendly interface for data acquisition, analysis, and report generation. To learn more about how the 8D Photonics Wafer Mapping Analysis Software can vastly improve your wafer characterization, click below.
